New Equipment | Test Equipment
Limited access testing using IEEE1149.1 standard is now an essential part of manufacturing test strategy for complex and high node count digital boards. Teradyne SPECTRUM series of In-Circuit testers provide Boundary Scan capabilities. The SPECTRUM d
New Equipment | Test Equipment
Teradyne’s Spectrum™ 8862 (TSSE) is a unique combinational in-circuit (ICT)/ functional test system that can lower overall costs and test times for manufacturers that prefer to combine functional and ICT test capabilities on a single system. Spectrum
Used SMT Equipment | In-Circuit Testers
Teradyne 8855 Spectrum In-Circuit Tester *** View Report Links *** Configuration Details: Chassis 0 Slot 0: FIB/DeltaScan board Slot 1: VP board Slot 2: High Voltage PRISM board Slot 3: CC2 master and expander board Slot 4: CC2 master and ex
Used SMT Equipment | In-Circuit Testers
Teradyne 8855 Spectrum In-Circuit Tester Configuration Details: Chassis 0 Slot 0: FIB/DeltaScan board Slot 1: VP board Slot 2: High Voltage PRISM board Slot 3: CC2 master and expander board Slot 4: CC2 master and expander board Slot 5: CC2 m
